Description: SHRINK-WRAPPED NEW: SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS 2014 HARDCOVER SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS by Nobuo Tanaka (Author) OUR REFERENCE: ORD7-S0-HC-184816789X-2P4-BRN-B18-2014 DESCRIPTION The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Product details Publisher : Imperial College Pr (June 6, 2014)Language : EnglishHardcover : 571 pagesISBN-10 : 184816789XISBN-13 : 978-1848167896
Price: 149.99 USD
Location: Phoenix, Arizona
End Time: 2024-12-23T11:06:38.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
All returns accepted: ReturnsNotAccepted
ISBN: 184816789X
Publisher: Imperial College Press
Topic: Nanoscience, Physics / Optics & Light, Nanotechnology & Mems, Microscopes & Microscopy, Mechanics / Hydrodynamics
Publication Year: 2014
Book Title: Scanning Transmission Electron Microscopy of Nanomaterials : Basics of Imaging and Analysis
Number of Pages: 400 Pages
Language: English
Illustrator: Yes
Genre: Technology & Engineering, Science
Item Weight: 0 Oz
Author: Nobuo Tanaka
Format: Hardcover
