Description: Please refer to the section BELOW (and NOT ABOVE) this line for the product details - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - Title:Thermal-Aware Testing Of Digital Vlsi Circuits And SystemsISBN13:9780367607098ISBN10:0367607093Author:Chattopadhyay, Santanu (Author)Description:This Book Aims To Highlight The Research Activities In The Domain Of Thermal-Aware Testing Thermal-Aware Testing Can Be Employed Both At Circuit Level And At System Leveldescribes Range Of Algorithms For Addressing Thermal-Aware Test Issue, Presents Comparison Of Temperature Reduction With Power-Aware Techniques And Include Results On Benchmark Circuits And Systems For Different Techniquesthis Book Will Be Suitable For Researchers Working On Power- And Thermal-Aware Design And The Testing Of Digital Vlsi Chips Binding:Paperback, PaperbackPublisher:CRC PressPublication Date:2020-07-02Weight:0.39 lbsDimensions:0.3'' H x 8.4'' L x 5.4'' WNumber of Pages:118Language:English
Price: 32.53 USD
Location: USA
End Time: 2024-12-03T17:43:21.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Return policy details:
Author: Chattopadhyay, Santanu (Author)
Book Title: Thermal-Aware Testing Of Digital Vlsi Circuits And Systems
Language: English
Format: Paperback
Publisher: CRC Press
Publication Year: 2020
Item Weight: 0.39 lbs
