Description: Vlsi Fault Modeling and Testing Techniques, Hardcover by Zobrist, George W. (EDT), ISBN 0893917818, ISBN-13 9780893917814, Like New Used, Free shipping in the US Inaugurates a new Ablex series covering the state-of-the-art in various aspects of VLSI testing, fault modeling, environments, routing and placement, and logic design. Among the topics addressed in the present text are physical fault modeling and simulation for VLSI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis methods. Annotation copyright Book News, Inc. Portland, Or.
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Book Title: Vlsi Fault Modeling and Testing Techniques
Author: Zobrist, George W. (EDT)
Language: English
