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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, J
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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, Jul
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, J
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Testing and Diagnosis of VLSI and ULSI by F. Lombardi (English) Paperback Book
Testing and Diagnosis of VLSI and ULSI by F. Lombardi (English) Paperback Book

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VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability

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Built in Test for VLSI: Pseudorandom Techniques, like new
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VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, Ju
VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, Ju

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Thermal-Aware Testing of Digital VLSI Circuits and Systems - 9780815378822
Thermal-Aware Testing of Digital VLSI Circuits and Systems - 9780815378822

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev (Eng
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev (Eng

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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, Ju
VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, Ju

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Nicolaidis - On-Line Testing for VLSI - New paperback or softback - S9000z
Nicolaidis - On-Line Testing for VLSI - New paperback or softback - S9000z

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Hierarchical Modeling for VLSI Circuit Testing by Debashis Bhattacharya (English
Hierarchical Modeling for VLSI Circuit Testing by Debashis Bhattacharya (English

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Progress in VLSI Design and Test: 16th International Symposium on VSLI Design an
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Delay Fault Testing for VLSI Circuits - 9781461375616
Delay Fault Testing for VLSI Circuits - 9781461375616

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Built In Test for VLSI: Pseudorandom Techniques by Paul H. Bardell (English) Har
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VLSI Design and Test for Systems Dependability - 9784431568636
VLSI Design and Test for Systems Dependability - 9784431568636

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Vlsi Design and Test : 17th International Symposium, Vdat 2013, Jaipur, India...

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Stan
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Stan

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VLSI Design and Test for Systems Dependability by Shojiro Asai (English) Hardcov
VLSI Design and Test for Systems Dependability by Shojiro Asai (English) Hardcov

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Microfluidic Very Large Scale Integration (Vlsi): Modeling, Simulation, Testing,
Microfluidic Very Large Scale Integration (Vlsi): Modeling, Simulation, Testing,

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Vlsi Design and Test : 21st International Symposium, Vdat 2017, Roorkee, Indi...
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Contactless VLSI Measurement and Testing Techniques - 9783319696720

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5751 ADVANTEST HIFIX VLSI TEST SYSTEM T6672 IN CARRYING CASE 1024CH
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Contactless VLSI Measurement and Testing Techniques - 9783319888194
Contactless VLSI Measurement and Testing Techniques - 9783319888194

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VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India,...
VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India,...

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Vlsi Design and Test : 22nd International Symposium, Vdat 2018, Madurai, Indi...
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Test Generation of Crosstalk Delay Faults in VLSI Circuits - 9789811347849
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Hierarchical Modeling for Vlsi Circuit Testing, Paperback by Bhattacharya, De...

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On-Line Testing for VLSI by Michael Nicolaidis (English) Hardcover Book
On-Line Testing for VLSI by Michael Nicolaidis (English) Hardcover Book

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Iddq Testing of Vlsi Circuits, Paperback by Gulati, Ravi K. (EDT); Hawkins, C...
Iddq Testing of Vlsi Circuits, Paperback by Gulati, Ravi K. (EDT); Hawkins, C...

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On-Line Testing for Vlsi, Hardcover by Nicolaidis, Michael (EDT); Zorian, Yer...
On-Line Testing for Vlsi, Hardcover by Nicolaidis, Michael (EDT); Zorian, Yer...

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Test Generation of Crosstalk Delay Faults in VLSI Circuits - 9789811324925
Test Generation of Crosstalk Delay Faults in VLSI Circuits - 9789811324925

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circu
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circu

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Power-Constrained Testing of Vlsi Circuits, Hardcover by Nicolici, Nicola; Al...
Power-Constrained Testing of Vlsi Circuits, Hardcover by Nicolici, Nicola; Al...

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Test Generation of Crosstalk Delay Faults in Vlsi Circuits, Hardcover by Jaya...
Test Generation of Crosstalk Delay Faults in Vlsi Circuits, Hardcover by Jaya...

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Hierarchical Modeling for Vlsi Circuit Testing, Hardcover by Bhattacharya, De...

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Unified Methods for VLSI Simulation and Test Generation by Kwang-Ting Cheng (Eng

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Ando Electric IC/LSI/VLSI Test Systems Dic-8045A Memory Test System
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On Line-Testing for VLSI, Paperback by Nicolaidis, Michael (EDT); Zorian, Yer...

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev: New
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev: New

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Microfluidic Very Large Scale Integration (VLSI): Modeling, Simulation, Testing,

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Delay Fault Testing for VLSI Circuits by Angela Krstic (English) Hardcover Book

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